Materials Characterization
Equipment for analyzing and measuring the properties of a material, including its chemical, physical, mechanical, and electrical properties.
Bruker Dimension IconIR
Bruker’s large-sample Dimension IconIR™ system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications.
The Dimension IconIR platform has the highest performance in the world for AFM-IR measurements, leveraging advancements in IR laser sources, system designs, and operating modes.
ThermoScientific Phenom Pharos G2
Our Phenom Pharos G2 FEG-SEM expands its acceleration voltage range down to 1 kV, to better accommodate insulating and beam-sensitive samples, and up to 20 kV, with a resolution of 2.0 nm that reveals the finest details. This SEM totes blazing fast sample loading means fast sample exchange, which means higher productivity and throughput. Unlike other SEMs, which end up being fully booked, the Phenom Pharos G2 FEG-SEM performs imaging and analysis jobs so quickly that it serves well as a walk-up tool.
Additionally, Thermo Scientific ChemiSEM Technology revolutionizes and simplifies EDS analysis by fully integrating SEM and EDS functions into a single, cohesive user interface. Based on live quantification and building on decades of expertise in EDS analysis, the technology provides elemental information quickly and easily, guaranteeing reliable results in less time. ChemiSEM Technology now comes with a powerful new feature: ChemiPhase. ChemiPhase identifies unique phases with a big data approach, finding minor and trace elements while eliminating user bias and reducing possible mistakes.
Cypher ES Environmental AFM
The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The Cypher was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. With the Cypher ES, the same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical environments.
Agilent Cary 620 FTIR Microscope
Our FTIR Microscope with a motorized stage has two high‐sensitivity detectors capable of transmittance, reflectance, and ATR measurements from 850‐4000 cm‐1. The FPA detector is capable of mapping a 64×64 or 128×128 grid with a spatial resolution of 5.5 microns in one scan, with the ability to tile multiple scans. Using a Germanium ATR crystal with the FPA detector increases the resolution to 1.1 micrometers, although it sacrifices the tiling capabilities. The MCT detector can image a 40 to 100 micron square area with higher sensitivity and quicker scans. It also has 5x and 15x objectives and a built in camera for locating regions of interest.
Horiba Xplora Plus Raman Microscope
Our XploRA PLUS contains unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab as one of the best multi-user Raman microscopes. It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging. The simplicity and power of the XploRA PLUS is unmatched with an enhanced range of options such as multiple laser wavelengths, EMCCD detection, Raman polarisation and even Raman-AFM combination.
Mettler Toledo TGA/DSC 3+
The METTLER TOLEDO TGA/DSC 3+ offers cutting-edge capabilities for thermal analysis, combining precision, versatility, and robust performance. Equipped with Mettler Toledo’s renowned ultra-micro balance technology, it ensures sub-microgram resolution across the entire weighing range, with very low minimum weights on its 5-gram balances for accurate and precise measurements. The instrument’s wide temperature range, from ambient to 1600 °C, enables comprehensive sample analysis, while its DSC heat flow measurement allows for the simultaneous detection of thermal effects. Built-in gas flow control facilitates the investigation of samples under defined atmospheric conditions. Additionally, the TGA/DSC 3+ supports automated integration with TGA-FTIR, TGA-MS, and TGA-GC/MS systems for accurate evolved gas analyses. Its modular design accommodates evolving needs, safeguarding your investment, and its robust, endurance-tested sample robot ensures reliable, efficient operation 24/7. This combination of advanced features makes the TGA/DSC 3+ an ideal tool for researchers requiring high-performance thermal analysis.
Mettler Toledo TGA/DSC 3+
Our highly advanced nanoparticle analyzer helps solves the mysteries of the nano-world. A single device analyzes the three parameters that characterize nanoparticles: particle size, zeta potential, and molecular weight.
The SZ-100V2 Series measures particle size and particle distribution width by dynamic light scattering (DLS). Analysis is possible across a wide range of sample concentrations: Measurement of samples ranging from low ppm-order concentrations to high-concentration samples in double-digit percentages is possible. Accepts commercially available sampling cells. Analysis of small-volume samples is also possible.